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SDS6000L User Manual
2 7 0 i n t . s i g l e n t . c o m
29.6 Other Operation
Some operations are supported under both the jitter analysis and normal mode. The compatible
operations are similar to the eye diagram, take Table 28.5 as a reference.
29.7 System Effect on Jitter Measure
The system's influence on the jitter measurement must be taken into consideration. It is important to
evaluate the degree of error introduced in the jitter measurement according to the specifications of the
measurement system itself. The methods applied to the measuring process also play an important role
in the jitter measurement.
The system error formula of oscilloscope jitter measurement is as follows:
2
2
Sample Clock
Noise
err Jitter
Slew rate

=+


Sample clock jitter and noise in the formula are possible from the oscilloscope itself. Besides, the slew
rate of the signal under test also is related to the system error according to the formula. The slew rate
is inversely proportional to the error when the noise value does not change. This indicates that we
should use signals with edges as fast as possible during jitter testing, and keep the signal at full scale
of the oscilloscope by adjusting the vertical scale.
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