FLUKE 8845A-EFPT Fine Point Extended Test Probe Adaptor Set

User Manual for the Fluke 8845A-EFPT Fine Point Extended Test Probe Adaptor Set - Page 72

For 8845A-EFPT.

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8808A
Users Manual
4-12
0
1
2
345
6
7
0
1
2
345
6
7
&
&
&
&
&
&
&
&
Logical OR
Standard
Event Status Register
Read Using *ESR?
Standard
Event Status Enable
Register
Read Using *ESE?
Write to Using *ESE
Power On
User Request
Command Error
Execution Error
Device Dependent Error
Query Error
Request Control
Operation Complete
0
1
2
37
0
1
2
3457
&
&
&
&
&
&
&
Logical OR
Status Byte Register
Service Request
Enable Register
MSS
6
RQS
ESB
MAV
Read Using *SRE?
Write to Using *SRE
Output Queue
Queue
Not-Empty
Read by Serial Poll
Read Using *STB?
Service
Request
Generation
aam21f.eps
Figure 4-2. Overview of Status Data Structures
Event Status and Event Status Enable Registers
The ESR assigns specified events to specific bits. (See Figure 4-3 and Table 4-6.) When a
bit in the ESR is set to 1, the event that corresponds to that bit occurred after the register
was last read or cleared. For example, if bit 3 (DDE) is set to 1, a device-dependent error
has occurred.
The ESE is a mask register that allows the host to enable or disable (mask) each bit in the
ESR. When a bit in the ESE is set to 1, the corresponding bit in the ESR is enabled.
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