Rohde & Schwarz MXO4-BNDL User Manual

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Easy navigation in frequency domain

The R&S®MXO4 spectrum function has the familiar inter-

face of a spectrum analyzer. The spectrum setup dialog

offers basic spectrum analyzer controls such as start and

stop frequency and resolution bandwidth. In spectrum

mode, the R&S®MXO4 time domain settings are unaf-

fected. This makes navigation in the frequency domain

an easy task. The maximum FFT capture bandwidth cor-

responds to the R&S®MXO4 series bandwidth allowing a

quick overview of all the test device’s emissions from 0Hz

to 1.5GHz.

EMI DEBUGGING

The right setup with the right probes

Rohde & Schwarz offers the compact R&S®HZ-15 near-field

probe set, which is particularly helpful for EMI debugging

of embedded designs. The most compact probe in this set

allows capturing of near-field emissions from single circuit

lines. The R&S®HZ-15 covers the frequency range from

30MHz to 3GHz. With reduced sensitivity, it can also be

used below 30MHz. The optional R&S®HZ-16 preamplifier

provides 20dB gain in the frequency range from 100kHz

to 3GHz, in case higher sensitivity is needed.

Ultra-fast spectrum acquisitions for spurious spectrum events

The R&S®MXO4 series architecture is optimized both in

hardware and software to leverage the powerful ASIC

capabilities to deliver fast and responsive spectrum cap-

tures. This is critical in detecting random and spurious

emissions that are otherwise hidden due to the blind time

in acquisitions. The spectrum analysis is equipped with

max. hold, min. hold and average arithmetics to keep track

of spectrum events that occur during the testing. These

are important test receiver functions and now they come

standard on the R&S®MXO4 series spectrum function.

Gated spectrum for correlated time and frequency analysis

With the gated spectrum function, it is possible to restrict the spectrum analysis to a user-defined region of the captured

time domain signal. Excessive spectral emissions can be correlated to dedicated time periods in a signal. Typical appli-

cations include the correlation of unwanted emissions to fast switching edges in switched-mode power supplies or to

data transfers on bus interfaces. Having identified the problem, the design engineer can easily check the effectiveness

of different solutions such as blocking capacitors or reduced rise/fall times by observing the level change of the spectral

emission.

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Rohde & Schwarz MXO4-BNDL Oscilloscope