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28 II Ex
Users Manual
26
Diode Tests
WCaution
To prevent damage to the Product or to the
equipment under test, disconnect circuit
power and discharge all high-voltage
capacitors before you do a diode test.
Use the diode test to examine diodes, transistors, silicon
controlled rectifiers (SCRs), and other semiconductor
devices. This test sends current through a semiconductor
junction, while it measures the junction's voltage drop. A
good silicon junction drops between 0.5 V and 0.8 V.
To do an out of circuit diode test, set up the Product as
shown in Figure 7. For forward-bias measurements on a
semiconductor component, put the red test lead on the
component's positive terminal and put the black lead on
the component's negative terminal.
In a circuit, a good diode will cause a forward-bias
measurement of 0.5 V to 0.8 V. A reverse-bias
measurement can be different because of the resistance
of other pathways between the probe tips.
A short beep sounds if the diode is good (<0.85 V). A
continuous beep sounds if the measurement is ≤0.100 V.
This measurement shows a short circuit. The display
shows “OL” if the diode is open.
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